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Products or Machinery
Solar Metrology manufactures and markets a complete suite of X-Ray Fluorescence (XRF) Tools that provide CIGS and CdTe PV film composition and thickness characterization that is used for PV development and process control. XRF is non-contact, non-destructive technology ideally suited for thin film PV process control of CIGS and CdTe metal film PV structures.
Our portfolio of tools include a bench-top instrument designed for characterization in the R&D laboratory and in-process tools that include configurations for handling glass panel processes and reel-to-reel processes, including in-deposition-tool (in-situ) process insertion.